Applications: Material Analysis
Achieve speed, precision and accuracy with full spectra XRF analysis on every pixel.
X-ray fluorescence (XRF) is a vital non-destructive analytical technique applied in various fields for determining the elemental composition of materials. X-ray fluorescence detection uses a primary X-ray source to excite the atoms within a sample. This excitation causes the atoms to emit fluorescent (or secondary) X-rays. The emitted X-rays are specific to each element present in the sample, akin to a unique fingerprint for that element.
ADVACAM’s Timepix 3 cameras with Si or CdTe sensor allow the measurement of full spectra for each pixel. Measured spectra can then be analyzed, and particular elements can be separated according to their X-ray fluorescence energies. For instance, this approach is demonstrated on the sample of a printed circuit board, where the components are very well spatially separated. Similarly, the method was proven to be able to distinguish metals contained in a rock. The suitability for Real-Time Mineral X-Ray Analysis was proved within the EU Horizon 2020 X-MINE project.
