WidePIX CHROMATIC SenseEdge

A multi-chip industrial scanner and imaging detector introduces edge-sensing capability, where the sensitive area reaches the very edge of the detector with no borders. Ideal for detailed X-ray inspections of complex or irregular shapes. The detector is based on the Medipix3 hybrid technology with a silicon or CdTe sensors. Features simplified connectivity via a single power-over-Ethernet (PoE) cable.

Readout chip: Medipix3
Pixel pitch: 55 μm
Resolution: 9 lp/mm
Readout speed: up to 170 (1x5 tiles), up to 80 (2x5 tiles) frames/s
Thresholds per pixel: 1 or 2 (based on selected mode)
Threshold step resolution: 0.1 keV (valid for custom calibration in Super High Gain Mode)
Energy resolution: 0.7-2.0 keV (Si) and 1.2-3.6 (CdTe)
Min detectable energy: 5 keV (Si) and 8 keV (CdTe)
Pixel mode of operation: Counting in Single Pixel Mode (SPM) or Charge Summing Mode (CSM)
Counter depth: 12 or 24 bits (configurable)

Dimensions: 249.5 x 75 x 61 mm
Weight: 91 g
Connectivity: Ethernet, water cooling interface
Software: PIXet Pro

Non-destructive testing

Experience the power of our advanced cameras, delivering unmatched sensitivity, spatial resolution, and contrast. Our single-photon-counting cameras quickly uncover hidden details in various materials, from light composites to thick welded parts. The technology surpresses scattered radiation, capturing high quality images in record time. The capabilities of our photon-counting X-ray imaging unveil internal material structures and spot defects like porosity, fiber orientation, micro-cracks, and delaminations with unparalleled precision. Elevate your NDT with our industry-leading solutions, setting new standards in defect detection.
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