Examples of measurements with Timepix detectors utilized by our spin-off company AdvaScope. On the left side: An EBSD diffraction pattern of Nickel. On the right: A diffraction pattern measured for the Si sample aligned to [100] zone axis. Below: An example of an implementation of a Timepix3 detector together with the retraction device that has been installed on a TEM. The external electronics are located and attached to the casing. It is connected via a PCB feedthrough to the vacuum chamber. Visit Advascope website ›
![Examples of measurements with Timepix detectors utilized by our spin-off company AdvaScope. On the left side: An EBSD diffraction pattern of Nickel. On the right: A diffraction pattern measured for the Si sample aligned to [100] zone axis. Below: An example of an implementation of a Timepix3 detector together with the retraction device that has been installed on a TEM. The external electronics are located and attached to the casing. It is connected via a PCB feedthrough to the vacuum chamber.](https://advacam.com/content/uploads/2023/06/Delaminations-between-layers.jpg)