X-ray diffraction

X-ray diffraction is analytical method based on inspection of crystalline structure of samples used in applications, such as metallurgy, mineralogy, powders, pigments, polymers, surface layers and strain mapping. The traditional X-ray diffraction uses monochromatic X-rays which make the apparatus large and slow. ADVACAM’s spectral detectors based on Timepix3 chip with high resolution makes the diffraction system fast and compact.

Polychromatic X-ray diffraction

The polychromatic X-ray beam (instead of monochromatic) can be used with ADVACAM’s energy dispersive detectors. Polychromatic X-ray diffraction system is compact and less complex than the one with monochromatic X-ray that require mechanically moving parts. The high resolution spectral detector can be placed close to the sample covering large solid angle.

The high intensity of the polychromatic X-ray beam enables high speed of data accumulation. Broad energy range from 3 to 150 keV can be covered with the polychromatic X-ray tube. The high X-ray energies allow transmission and diffraction study of highly absorbing samples, such as stainless steel, heavy metals and minerals. The X-ray diffraction at high energies has only been possible with large synchrotron accelerators so far. ADVACAM's spectral detectors can do it on a table top system.

The example on the right shows a polychromatic diffraction images of silicon powder using a standard and spectral detector AdvaPIX TPX3. The standard detector mixes all the energies and image is useless in identifying diffractograms in a stationary diffraction setup. The spectral detector is able to observe the rings clearly and identify multiple diffractograms. By recalculating and summing the diffractograms (1 keV energy intervals) one is able to visualise the lattice constant of the material shown on the right for the Si powder.

Polychromatic X-ray diffraction operation principle and comparison between standard and spectral detector.

Example of experimental minituarized polyhromatic X-ray diffraction setup with AdvaPIX TPX3 detector.

X-ray diffraction of silicon powder using AdvaPIX TPX3 detector in distance of 25 mm with polychromatic X-ray beam of 0.5 x 0.5 mm at 80 kVp.

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